Afm, stm and sts studies of grain boundaries And ion-beam induced defects in MGB2

Narayan, HimanshuNarlikar, A. V.Herrmann, P. S. P.Samanta, S. B.Gupta, AnuragKanjilal, D.Muranaka, T.Akimitsu, J.Vijayaraghavan, R.2016-12-052016-12-052001-061-59033-131-1http://repository.tml.nul.ls/handle/20.500.14155/806Chapter 25enAfm, stm and sts studies of grain boundaries And ion-beam induced defects in MGB2Book chapter