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Faculty of Science and Technology
Books
Afm, stm and sts studies of grain boundaries And ion-beam induced defects in MGB2
Afm, stm and sts studies of grain boundaries And ion-beam induced defects in MGB2
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Narayan_AFM_2001.pdf
(418.63 KB)
Date
2001-06
Authors
Narayan, Himanshu
Narlikar, A. V.
Herrmann, P. S. P.
Samanta, S. B.
Gupta, Anurag
Kanjilal, D.
Muranaka, T.
Akimitsu, J.
Vijayaraghavan, R.
Journal Title
Journal ISSN
Volume Title
Publisher
Nova Science Publishers
Abstract
Description
Chapter 25
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URI
http://repository.tml.nul.ls/handle/20.500.14155/806
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