Afm, stm and sts studies of grain boundaries And ion-beam induced defects in MGB2

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dc.contributor.authorNarayan, Himanshu
dc.contributor.authorNarlikar, A. V.
dc.contributor.authorHerrmann, P. S. P.
dc.contributor.authorSamanta, S. B.
dc.contributor.authorGupta, Anurag
dc.contributor.authorKanjilal, D.
dc.contributor.authorMuranaka, T.
dc.contributor.authorAkimitsu, J.
dc.contributor.authorVijayaraghavan, R.
dc.date.accessioned2016-12-05T15:19:03Z
dc.date.available2016-12-05T15:19:03Z
dc.date.issued2001-06
dc.descriptionChapter 25en_ZA
dc.identifier.isbn1-59033-131-1
dc.identifier.urihttp://repository.tml.nul.ls/handle/20.500.14155/806
dc.language.isoenen_ZA
dc.publisherNova Science Publishersen_ZA
dc.sourceStudies of High Temperature Superconductors Volume 38en_ZA
dc.titleAfm, stm and sts studies of grain boundaries And ion-beam induced defects in MGB2en_ZA
dc.typeBook chapteren_ZA
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